Feature

Hast  is widely used in integrated circuit/microelectronics /IC and other fields, the test purpose is to improve the environmental stress, such as temperature and working stress applied to the product voltage/load, speed up the test process, shorten the product or system life test time.It is used to investigate and analyze the test sample when the wear and service life problems as well as the service life failures.The shape of the distribution function, and the tests conducted to analyze the causes of the increase in failure rates.